Portable Benchtop XRF Analyzer EDX-660
 
EDX600 XRF X-Ray Fluorescence Spectrometer

Portable Benchtop XRF Analyzer EDX-660

Portable bench top EDX X-Ray spectrophotometer, the EDX 660 utilizes X-ray Fluorescence technology. It is economically priced, and the precision and ease of operation together with the advantages of portability and integrated notebook, makes it the most favored portable XRF instrument on the market. As with all of Qualitest XRF instruments the Windows based software is extremely user friendly and the operator does not require any advanced training. The EDX 660 is delivered with a sturdy case and a laptop with pre-installed software. The EDX 660 is an ideal solution for metal, soil and mining analysis on the go.

Portable Benchtop XRF Analyzer EDX-660
 
Portable Benchtop XRF Analyzer EDX-660
EDX-660 Features
  • Portability with the performance of a bench-top analyzer, durable case in carry on style with wheels and foldable handle.
  • Two Detector Options:
    EDX-660 with a Proportional Counter Detector Tube
    EDX-660P : PIN-Diode Detector System.
  • Easy to wheel from location to location; weight only fifty (50) lbs.
  • Analysis of a wide range of sample materials (powder, liquids, etc).
  • Common Applications: Precious metal testing, Metal Thickness, On-Site Mining Analysis and Soil Testing.
 
Specification of Portable Benchtop XRF Analyzer EDX-660
Measurable Elements
(Proportional Counter)
Au Ag Cu Zn Ni Pd Pt Rh Cd Ru (Metals)
Measurable Elements
(Si-PIN Detector)
S-U
Measurable SubstanceSolid, Liquid, Powder
Content ratio Range0.1%---99.99%
Measurement time60---300 seconds
Accuracy0.1%
Coating thickness precision0.01~0.05 mm
Weight23kg (51lb)
Dimension (Case)350*550*400mm (14x22x16 in.)
X-Ray sourceX-ray tube
DetectorProportional counter, Si-PIN available as upgrade (EDX660P)
Typical Applications
Typical Applications
X-ray Fluorescence Excitation Principle

EDX 660 uses X-ray beam from X-ray tube to irradiate the sample, and the element atoms will be excited and emit the secondary X-ray fluorescence characteristic for its own energy. Then these elements get identified and its content measured. The working principle is as follows:

X-ray Fluorescence Excitation Principle

For further information or to place an order for the Portable Benchtop XRF Analyzer EDX-660, please CLICK HERE, call us Toll-Free at: 1.877.884.TEST, or click on the "HOW TO ORDER" Button