Portable XRF Analyzer QualiX-1000 For Metals, Alloys, RoHS, Plastics, Electronics.
XRF (X-ray fluorescence spectrometry) is a non-destructive analytical technique used to identify and determine the concentrations of elements present in solid, powdered and liquid samples. XRF is capable of measuring elements from Beryllium (Be) to Uranium (U) and beyond at trace levels and up to 100%. The EDX XRF X-ray fluorescence spectrometer measures the individual component wavelengths of the fluorescent emission produced by a sample when irradiated with X-rays. EDX XRF X-ray fluorescence spectrometer includes special electronics and software modules to take care that all radiation is properly analyzed in the detector. Our range of EDX XRF X-ray fluorescence spectrometers covers wide range of application and industries.
QualiX-G1 XRF X-ray Fluorescence Spectrometer is particulary recommended for Metal Analysis producers and users requiring a Metal Analysis for constant heavy use.
QualiX-R1 XRF X-ray Fluorescence Spectrometer is particulary recommended for RoHS substance detection and full element analysis and jewelry analysis.
QualiX-P1 Energy Dispersive XRF X-Ray Fluorescence Spectrometer is ideal for precious metal, gold, jewellery applications as well as electronics.
QualiX-S2 X-ray Fluorescence Spectrometer is specially designed for RoHS substance detection (Cd, Pb, Cr, Hg, and Br) and full element analysis- sulfur to uranium.
QualiX-T1 XRF X-Ray Fluorescence Spectrometer which is particulary recommended for Metal Analysis producers and users requiring a Metal Analysis for constant heavy use.
QualiX-M1 is a desktop model spectrometer. It is equipped with globally advanced analysis technology. It efficiently reduces testing interference and improves energy resolution of Mg, Al, Si, P and other elements in geology and minerals.
QualiX-S1 X-ray Fluorescence Spectrometer uses the physical test method, i.e. X-ray fluorescence spectrometry, to measure the content of the sulfur present in the petrochemicals.
X-Ray Fluorescence Spectrometer QualiX-G2 meets the demands of precious metal testing by virtue of its unique configuration, full-functional test software and user-friendly operation interface, makes test easier and simpler with its humanized design.
X-Ray Fluorescence Spectrometer QualiX-G3 is a new generation touch screen precious metal analyzer of Qualitest, which facilitates the precious metal detection with its unique configuration, powerful software and user-friendly interface.
QualiX-W1 wavelength dispersive spectrometer is a high precision analytical instrument, being able to analyze contents of several elements in a substance precisely, quantitatively and simultaneously.
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The new Pocket III X-ray fluorescence (XRF) analyzer takes hand-held analytical performance to a new level. Pocket III combines an advanced Si-PIN detector with a powerful 40kV X-ray tube. The Si-PIN detectors are electronically refrigerated eliminating the need for liquid nitrogen and allows the instrument to be used at normal room temperatures without additional accessories or procedures. This cutting edge technology delivers fast and highly accurate measurements.
EDX Pocket III is the latest development in Handheld X-Ray Fluorescence Spectrophotometers. This unit has been specifically developed for on site analysis. Pocket III is available with advanced software packages for different application fields such as RoHS inspection, PMI Alloy inspection, scrap metal recycling, mineral and mining, precious metals evaluation, soil and environmental inspection. Pocket III is the smallest, fastest, most functional and accurate Si-PIN XRF spectrophotometers available on the market.
RoHS inspectors, scrap sorters, mine mappers and many others finally have the robust, moderately priced, mobile XRF Element testing tool they have been waiting for. Pocket III assures laboratory quality analysis of high and low alloy steel, minerals, precious metals, RoHS elements and soil. The powerful algorithms also allows for analysis of light elements such as Al and Mg through analysis of heavier elements. The powerful combination of the Si-PIN, 40 kV X-ray means that the Pocket III can accurately analyze and identify metal alloys in seconds. Restricted elements, lead in toys, contaminants in soil and small concentrations in ores can be accurately measured at impressive speed. Trace element results, down to ppm level, can be achieved in just seconds. To find out more about how EDX Pocket III can solve your portable spectroscopy needs please visit www.WorldofTest.com/edxpocket.htm or call us toll free at 1.877.884.TEST (8378).
Qualitest offers a wide range of X-ray florescence spectrophotometers. Our complete XRF portfolio is available at www.WorldofTest.com/xrf.htm and features advanced bench top and portable XRF spectrophotometers for all applications.