High resolution coating thickness gauge
Plating thickness analysis expert
Rapid Accurate Non-destructive:
- QualiX-T1 XRF X-Ray Fluorescence Spectrometer is tailor-made for rapid and non-destructive detection of plating thickness and elemental analysis.
- QualiX-T1 XRF X-Ray Fluorescence Spectrometer adopts the top lightening structure, 3-D movable sample platform and laser positioning system, which enables the
- possibility of the point-by-point detection of plating thickness and elemental content on large-size parts.
- QualiX-T1 XRF X-Ray Fluorescence Spectrometer is equipped with top lightening structure, 3-D movable sample
- platform double-lasser positioning system, and open sample chamber.
- The up-and-down movable glass scield cap helps prevent the leakage of X-rays.
- QualiX-T1 XRF X-ray Fluorescence Spectrometer has a modern design, structure and attractive color.
- A set of functional software is also fully supplied
- Electro plating, Ornament processing, Precious metal.
- Elemental content detection of precious metals like Au, Pt, Ag, and ornaments
- Metal plating thickness analysis and elemental detection of plating and eletroplating solution.
- Mainly used in precious metal, ornoment processing, banks, ornament sale and detection and electroplating industries
- Analysis range - (K) ~ (U)
- Many layers can be analyzed at a time
- The detection limit of thickness can reach - 0.01 μm
- More than 5 plating layers can be analyzed simultaneously
- Independent matrix effect correction model: most
- Advanced thickness analysis methoAdvanced method
- Repeatability is up to 0.01 μm
- Ambient temperature range - 15-30°c
- Working voltage - AC220v ± 5v
- AC purified stabilized voltage power supply recommended
- Open sample chamber
- 3-D movement is realized by 2-D movable platform and up and down movement of detector and X-ray tube
- Double laser positioning system
- Automatic collimator switch
- Glass schield cap
- Proportional detector
- Electronic circuit for signal detection
- High and low voltage power supply
- Electro-cooling Si-PIN semiconductor detector instead of liquid nitrogen cooling one
- X-ray tube
- PC and ink-jet printer
- Sample Chamber: 517*352*150mm
- Machine Dimension: 648*490*544mm
- The shield cover of the instrument has interlocks with high voltage of X-ray tube, when the cover is open the X-ray tube is shut down.
- The up and down movable glass shield help to prevent the radiation of X-ray away from operator
- X-ray tube has interlocks with software. The tube is shut down when software is not running