Precious Metals X-Ray Fluorescence Spectrometer- QualiX-P1-II
Parent Product
Best Application: Precious metal analysis: Yellow & white gold and others
XRF Spectrometer – QualiX- P1-II is excellent for precious metal analysis and is ideally applied to electronic/ electrical appliances and ornament processing.
Applications
Applications
The two main applications for the analyzer are- alloy determination/ chemical analysis, soil analysis and mineral analysis
Alloy Determination/ Chemical Analysis
XRF analyzers are used to the fullest potential when determining the alloy under examination and in obtaining a chemical analysis of the constituent elements of samples. Preparation of the sample should be cleaned of all dust, rust, oils etc. If the sample is already cleaned there is no need for preparation, a dirty sample will have a significant effect on the analysis. There are many factors that can cause errors for alloy sample analysis, factors such as specimen size or cleanness can disrupt readings. Solutions for these factors can be as simple as painting or coating the surface of the specimen, or if the sample size is too small multiple pieces can be used at the same time.
Features/Advantages
Features
Features
- Super high precision, upmost performance
- Electro-cooling Si-Pin semiconductor detector instead of liquid nitrogen cooling detector
- Specially developed professional software, with friendly interface
- Free choice of filters and auto switch of collimators
- Multi-variant non-linear regression procedure; independent matrix effect correction model
- Triple safety protection mode; steel structure; elegant and fashionable
- Manually open and close sample chamber, safe and convenient
- Signal-to-Noise Enhancer (SNE), greatly improving the stability and accuracy of the measurement
- In-built high resolution camera, convenient for users to analyze samples at any moment
Advantages XRF
- Super high resolution, ranking the first class: Equipped with the best silicon drift detector (SDD), the instrument, with the resolution of 139±5ev ,compared to the common Si-PIN detector resolution of 160±5eV of , can better test the content of iridium and gold in platinum.
- Super high precision, upmost performance: Equipped with 25mm2 large dimensional beryllium window detector, it greatly enhances the sample’s receiving ability of X-ray fluorescence. With digital multi-channel analysis technology, it improves the analytical speed and integral processing ability. Its counting rate accounts to 80,000, increasing 5 to 10 times as compared to common Si-PIN 6mm2 detector and its precision improves 2 to 4 times.
- Super CMOS HD camera, precise positioning: Super CMOS HD camera, providing more clear images and achieving precise positioning.
- Small collimator, testing tiny parts: Providing several kinds of collimators whose minimum diameter is 0.2mm, it can test tiny parts and also can automatically switch collimators according to different testing requirements, easing and précising the testing.
- One-key intelligent operation: Fully application of basic parameters method, it only needs one-key for matching the curves. One-key intelligent operation
Limitations XRF
- XRF is a surface/near surface technique meaning the analyzer only measures the portion of the sample directly in front of the window
Theory/Method
Theory/Method
When certain elements are bombarded with X-rays, electrons are emitted which results in energy released from the outer shells. Electrons can be ejected from the inner shell of atoms, causing them to drop down from the higher-level. When this event happens it is called “characteristic x-rays”.
The Process of X-ray Fluorescence
Bremsstrahlung x-rays and characteristic x-rays are created by a shower of electrons, this occurs by an XRF analyzer bombarding the atoms of the sample with x-rays. Each electron transition emits a characteristic x-ray (fluorescence photon) with an energy equal to the energy differences between the two shells for the specific element. Electrons have the same fixed energy levels in all atoms of the same element, each similar electron transition emits an x-ray of the same discreet energy. Therefore when electrons are ejected from atoms of the same element, the emitted x-rays are identical.
Technical Specifications
Technical Specifications
|
Analytical Content |
ppm to 99.99% |
|
Models |
Multi-optional analysis and identification models |
|
Independent matrix effect correction model |
|
|
Long-term working stability |
0.05% (content 96%↑) |
|
Ambient temperature |
15°C to 30°C |
|
Power input |
AC 110/220V ±5V (equipped with purified stabilized voltage power supply is recommended) |
|
Energy resolution |
139±5eV |
|
Sample chamber dimension |
439mm×300mm×96mm |
|
Instrument dimension |
550mm×410mm×320mm |
|
Weight |
45kg |
|
Standard configurations |
Signal-to-Noise enhancer |
|
SDD (Silicon Drift Detector) |
|
|
Digital multi-channel analysis system |
|
|
Big power X-ray light tube |
5% Iridium Content in Platinum (The red areas) 5% Iridium Content in Platinum (The red areas)