M1F Controller
 | The M1F controller is an intermediate and versatile controller for material testing, capable of analyzing load cells, torque sensors, pressure sensors, encoders, and various other signals. All units can be adjusted according to the user’s requirements. |
It features real-time display and can record process data over short periods. Data can be restored via a USB port and exported to an Excel sheet for further analysis. Specified software is available for additional analysis, and users can also write their own software. If customers have special requirements, the device can be modified and customized to meet their needs.
Software functions
The M1F controller offers a data sample rate of up to 400 Hz. It can be operated via keyboard and mouse, or by using up and down buttons to adjust the fixture position. It is compatible with Windows 7, 8, and 10 systems. The software supports multiple languages, including Chinese, English, Japanese, Korean, Spanish, Polish, Portuguese, and German. The operating mode uses a TCP/IP interface for two-way transmission, allowing the computer to directly control the machine’s actions. Multiple test data can be imported and displayed simultaneously. Units can be selected in either Metric or Imperial systems. The form is flexible, allowing for self-planned information analysis. Data names and formulas can be customized. The test screen can display data, graphics, or both simultaneously. Data processing includes storing, importing, listing, and statistical comparison. The graph’s X-Y axis can be adjusted, and specific marks, interval marks, and slopes can be added. The controller supports tensile, compression, bending, peeling, spring, and other tests. Software protection includes overload, over-displacement, and over-time protection. Specimen settings are modularized for easy setup, and test conditions are modularized to reduce human error. Key data capture allows for setting upper and lower limits of test data specifications. The controller supports multiple sets of I/O signals to enhance testing mechanisms.
Dimensions
