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Integrated physical positioning holes | |
Measurement repeatability※ | |
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| Full-band balanced LED light source |
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| Spectral reflectance, CIE-Lab, CIE-LCh, HunterLab, CIE-Luv, XYZ, Yxy, RGB color difference (ΔE*ab, ΔE*cmc, ΔE*94, ΔE*00), whiteness (ASTME313-00, ASTME313 -73, CIE, ISO2470/R457, AATCC, Hunter, TaubeBerger Stensby) yellowness (ASTM D1925, ASTM E313-00, ASTM E313-73) blackness (My, dM), stain fastness, color fastness, Tint (ASTM E313-00) Color density CMYK (A, T, E, M), metamerism index Milm, Munsell, hiding power, strength (dye strength, tinting strength) |
| A, B, C, D50, D55, D65, D75, F1, F2, F3, F4, F5, F6, F7, F8, F9, F10, F11, F12, CWF, U30, U35, DLF, NBF, TL83, TL84, ID50, ID65, LED-B1, LED-B2, LED-B3, LED-B4, LED-B5, LED-BH1, LED-RGB1, LED-V1, LED-V2 |
| Android, iOS, Windows, WeChat applet, Hongmeng |
| Ensure measurement is qualified |
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Integrating sphere diameter | |
| CIENo.15, ISO7724-1, ASTME1164, DIN5033Teil7 |
| High-precision nano spectroscopic device |
| Silicon photodiode array dual 16 groups |
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Reflectivity measurement range | |
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| Full color screen, 3.5 inches |
| Can continuously measure 8000 times on a single charge, 7.2V/3000mAh |
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| Instrument: 10,000 items; APP: Mass storage |
※Diffuse illumination/8° direction reception, including specular reflected light/removing specular reflected light ※※After the whiteboard is calibrated, measure the whiteboard 30 times at 5-second intervals and measure the standard deviation of the results using the MAV caliber. |