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CMOS Spark OES – QualiSpark™ CMOS

CMOS Spark OES
Parent Product
Optical Emission Spectrometer - OES
Standards
ASTM E1086
ASTM E1251
ASTM E1999
ASTM E3047
ASTM E415
ISO/IEC 17025
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CMOS Spark OES – QualiSpark™ CMOS

CMOS Spark OES (Optical Emission Spectrometers) is a fast method for verifying metal chemistry and a modern CMOS detection architecture, supporting both routine QA/QC and R&D workflows. Full Spectrum Spark OES – QualiSpark™ CMOS is designed for multi-base alloy analysis with a wide optical range.

QualiSpark™ CMOS combines a spark excitation stand, an argon-controlled spark chamber, a Paschen-Runge optical system, and full-spectrum acquisition software. The system is built for stable measurements across common base metals, while keeping daily operation simple for operators who run frequent grade checks and melt corrections.

QualiSpark™ CMOS is a full-spectrum Spark OES platform for elemental analysis of metallic samples through controlled spark discharge. The instrument captures characteristic emission lines produced during the discharge and converts them into quantitative results using calibrated curves and grade libraries.

The optical platform uses a high-efficiency holographic grating and a long focal-length layout to support broad wavelength coverage. The system also integrates software functions for calibration, grade identification, and process-focused calculations that help production teams make quick decisions on chemistry adjustments.

CMOS Spark OES – QualiSpark™ CMOS Applications

  • Incoming material verification: Spark OES helps confirm alloy grade and chemistry before materials enter machining, casting, forging, or heat-treatment steps. This reduces mix-ups between similar-looking grades and supports traceability across lots.
  • Melt shop and smelting control: The analysis software can support smelting workflows with grade identification and chemistry calculations used for melt correction decisions. Faster feedback enables tighter control of composition drift during production.
  • Metallurgy and foundry QA/QC: QualiSpark™ CMOS supports routine checks for cast irons, carbon and low-alloy steels, and non-ferrous alloys. Labs use Spark OES results to release heats, validate supplier certificates, and document conformance.
  • R&D and materials development: R&D teams use Spark OES to compare alloy iterations, screen impurity levels, and confirm composition during new material trials. Broad spectral coverage supports expansion to additional elements without changing hardware in many cases.
  • Aerospace, automotive, shipbuilding, and machinery manufacturing: These industries rely on composition verification for safety-critical parts and performance targets. Spark OES supports both production testing and failure analysis workflows tied to alloy chemistry.
CMOS Spark OES – QualiSpark™ CMOS

Standards

  • ASTM E415: Carbon and low-alloy steel analysis by spark atomic emission spectrometers.
  • ASTM E1086: Stainless steel analysis by spark atomic emission spectrometers.
  • ASTM E1251: Aluminum and aluminum alloys analysis by spark atomic emission spectrometers.
  • ASTM E1999: Cast iron analysis by spark atomic emission spectrometers.
  • ASTM E3047: Nickel alloys analysis by spark atomic emission spectrometers.
  • ISO/IEC 17025: Quality framework for competence of testing laboratories running instrumental methods.

CMOS Spark OES – QualiSpark™ CMOS Key Features

  • Full-spectrum optical platform (130–800 nm) for multi-element metal analysis, including lines used for light elements in the UV range.
  • Paschen–Runge Roland optical layout with an aberration-controlled design that supports consistent resolution across the wavelength range.
    CMOS Spark OES – QualiSpark™ CMOS 
     
  • High-efficiency holographic grating (500 mm focal length, 2700 grooves/mm) for stable dispersion and signal separation.
  • CMOS-based high-speed acquisition designed for fast sampling and full-spectrum data handling, with Gigabit Ethernet transmission for reliable communication.
  • Adaptive source interference immunity + real-time background correction to reduce noise and stabilize trace-level reporting.
  • Automatic pixel drift calibration + intelligent standardization to support repeatability when ambient conditions or maintenance events change the optical state.
  • All-solid-state digital spark source with adjustable energy and frequency (up to 1000 Hz) for flexible excitation across alloy matrices.
    CMOS Spark OES – QualiSpark™ CMOS 
     
  • Coaxial rotating spark stand with pressurized self-cleaning to reduce spark-stand cleaning workload and support longer continuous operation.
  • Lens isolation valve that isolates the optical system from the spark stand atmosphere to help reduce contamination risk tied to operator error.
  • Argon management design that optimizes replenishment intervals and lowers argon use compared with continuous purging approaches.
  • Analysis software built for production workflows, including grade identification, smelting-oriented charge calculation, carbon equivalent calculation, segmented curve switching, automatic method matching for unknowns, and multi-language UI support.

Standard base coverage noted in the brochure: Fe, Al, Cu, Ni, Co, Mg, Ti, Sn, Pb, Zn.

Theory and Method

CMOS Spark OES uses an electrical discharge between the sample and an electrode inside an argon atmosphere. The spark ablates a small amount of material and excites atoms and ions, producing light at wavelengths that are characteristic to each element.

The optical system separates emitted light into its component wavelengths, then the detector measures intensity at selected analytical lines. The software compares intensities to calibration curves built from certified reference materials, reporting concentrations and supporting grade matching based on configured limits and libraries.

CMOS Spark OES – QualiSpark™ CMOS Technical Specification

ItemQualiSpark™ CMOS
Spectral range130–800 nm
Optical systemPaschen-Runge mount Roland optical system
Grating / focal lengthHolographic grating, 500 mm focal length, 2700 grooves/mm
Power requirements220 V ±10%, single-phase, 10 A, 2.5 kVA (110V is also available)
Dimensions (W × D × H)500 mm × 825 mm × 451 mm
Weight100 kg
Applicable basesFe, Al, Cu, Ni, Co, Mg, Ti, Zn, Pb, Sn
CMOS Spark OES – QualiSpark™ CMOS

Optional Configurations

Small sample analysis (optional)

  • Irregular sample excitation stand for irregular pieces with an excitation area larger than Ø6 mm.
  • Rod-shaped small sample kit for diameters from 3.1 mm to 6 mm.
  • Wire/filament small sample kit for diameters ≤3 mm.

Remote transmission and display (optional)

  • Data output to remote LED displays, terminal printers, enterprise networks, LIMS, and related systems.

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Optical Emission Spectrometer - OES