X-Ray Fluorescence Spectrometer - QualiX-M1

X-Ray Fluorescence Spectrometer - QualiX-M1

Parent Product
XRF Spectrometers and Metal Analyzers

Best Application: Elemental Analyzer for all alloy or metal components, from Na to U.

QualiX-M1 is a desktop model spectrometer. It is equipped with globally advanced analysis technology. It efficiently reduces testing interference and improves energy resolution of Mg, Al, Si, P and other elements in geology and minerals. The instrument is multi-functional and meets international standards.

Applications

Application

  • Specialized in Alloy Testing
  • Mainly applies in alloy products, such as cuprum alloy, ferroalloy, nickel alloy etc.
  • Small and smooth design, simple but elegant. The silver light appearance demonstrates good design.
  • Super small sealed helium gas sample chamber.
  • The sample cup is designed of the same height, which ensures the measurement data to be accurate and saves the consumption of the standard sample and the gas.
  • High excitation efficiency end-window x-ray tube, large area Si-PIN detector, with good dissipation capability and high stability.
  • Top lighting design saves the traditional protection membrane, improves the test precision and prevents the sample from polluting the X-ray tube and be window of the detector.
  • X-ray radiation shielding design provides safety to the operators.

Alloy Determination/ Chemical Analysis

XRF analyzers are used to the fullest potential when determining the alloy under examination and in obtaining a chemical analysis of the constituent elements of samples. Preparation of the sample should be cleaned of all dust, rust, oils etc. If the sample is already cleaned there is no need for preparation, a dirty sample will have a significant effect on the analysis. There are many factors that can cause errors for alloy sample analysis, factors such as specimen size or cleanness can disrupt readings. Solutions for these factors can be as simple as painting or coating the surface of the specimen, or if the sample size is too small multiple pieces can be used at the same time.

Mineral Analysis

XRF is used to determine the concentration of minerals. The analysis includes determining the metal content in slag, concentration of metals in drill core and also through the refining process, ore samples and more. Mineral sample considerations includes samples that are measured “in-situ” require multiple locations, intrusive samples in plastic bags require several locations. Errors can be caused by the following, porosity, significant moisture changes, lack of sufficient specimen quantity etc.

Features/Advantages

Features

  • QualiX-M1 Mining Analyzer is specially designed for geology and mining industries
  • This instrument features high precision, fast testing speed and easy operation.
  • Several testing modes, including alloy analysis, soil analysis, precious analysis, RoHS analysis
  • Testing samples includes minerals, slag, rocks etc.
  • Testing samples can solids, liquids, and powders

Advantages

  • Highly efficient super-thin window x-ray light tube, which is specially developed for mineral  testing, reaches the international advanced level
  • Silicon Drift Detector (SDD), provides excellent energy linearity, energy resolution, energy spectrum characteristics and higher peak-to-base ratio
  • Patented product: Signal-Noise-Enhancer (SNE) improves the signal processing ability up to 25 times.
  • Low energy X-rays are used, delivering good results when exciting light elements such as Cl and Br.
  • Intelligent pumping vacuum system; shield air influence and enlarge testing scope.
  • Automatic spectrum stabilizer ensures the instrument is working.
  • Spectrum unfolding technology decomposes the spectrum peak; ensuring Cl, Br and other light elements testing have the same analysis accuracy.
  • Has multiple linear regression, reducing the inter-elemental absorption and enhancement effect
  • 2L vacuum pump
  • LCD makes the important parameter (tube voltage, tube current, vacuum) of the instrument obvious.

 

Theory/Method

XRF

When certain elements are bombarded with X-rays, electrons are emitted which result in energy released from the outer shells. Electrons can be ejected from the inner shell of atoms, causing them to drop down from the higher-level. When this event happens it is called “characteristic x-rays”.

The Process of X-ray Fluorescence

Bremsstrahlung x-rays and characteristic x-rays are created by a shower of electrons, this occurs by an XRF analyzer bombarding the atoms of the sample with x-rays. Each electron transition emits a characteristic x-ray (fluorescence photon) with an energy equal to the energy differences between the two shells for the specific element. Electrons have the same fixed energy levels in all atoms of the same element, each similar electron transition emits an x-ray of the same discreet energy. Therefore when electrons are ejected from atoms of the same element, the emitted x-rays are identical.

Limitations

  • Very Difficult to detect elements lighter than the atomic number Z=14, silicon (Si)
  • Difficult to detects elements lighter than atomic number Z=22 Titanium (Ti)
  • Most carbon steels, aluminum alloys and magnesium alloys cannot be measured
  • Minimum detection limits is in the parts per million (ppm) range
  • XRF is a surface/near surface technique meaning the analyzer only measures the portion of the sample directly in front of the window
  • Analyzer measures ALL material in front of analyzing window

 

Technical Specifications

Measurable range

Na to U

Analytical range

ppm—99.99% (different materials, with different analytical range)

Simultaneous analysis

Testing tens of elements simultaneously

Precision

0.05% (content 96%á)

Testing time

60s-200s

Resolution

(140±5) eV

Tube voltage

5KV-50KV

Tube current

50uA-1000uA

Power

200W

Voltage input

AC 220V (Optional: 110V)

Ambient temperature

15°C-30°C

Ambient humidity

35%-70%

Sample chamber size

320mm×100mm

Instrument dimension

660mm×510mm×350mm

Weight

65Kg

Standard Configurations

  • High efficient super-thin window x-ray light tube
  • High-performance electronic cooling SDD detector
  • Signal-to-Noise Enhancer
  • HD camera
  • Collimator and filter
  • Triple safety protection mode
  • 90mm×70mm LCD
  • Vacuum Pump

Installation Requirements

  • Power AC220V (optional 110V)

Contact Us

1-877-884-8378