Thickness X-Ray Fluorescence Spectrometer - QualiX-T1

Thickness X-Ray Fluorescence Spectrometer - QualiX-T1

Parent Product
XRF Spectrometers and Metal Analyzers

Best Application: Plating thickness measurement

QualiX-T1 is an instrument in plating thickness measurement with full-auto software operation, multi-point testing, software controlling the instrument and movable platform. It is a powerful instrument equipped with special software and widely applied in plating industries.

Applications
  • Electro plating, Ornament processing. Precious metal.
  • Elemental content detection of Precious metals like Au, Pt, Ag and ornaments.
  • Metal plating thickness analysis and elemental detection of plating and electroplating solution.
  • Mainly used in precious metal, ornament processing, banks, ornament sale and detection and electroplating industries
  • Detection for golden, platinum, silver, other precious metals and various jewelries content
  • Detection for plating thickness of metals, content of plating solution and plating
  • Mainly applied in precious metal and jewelry processing industries; bank, jewelry selling and detection institution, electroplating industries
Features/Advantages

Features

  • Top-lightening
  • Test parts can be lifted up and down
  • High-precision moveable platform
  • Small collimator
  • High-resolution detector
  • Visual operation
  • Auto locate height
  • Auto search spot
  • Mouse locates the test point
  • Well ray shielding
  • Super large chamber design
  • Safe protection of test

Advantages

  • The shield cover of the instrument has interlocks with high Voltage of X-ray tube, when the cover is open the X-ray is shut down.
  • The up and down movable glass shield help to prevent the radiation of X-ray away from operator
  • X-ray tube has interlocks with software. The tube is shut down when software is not running.
Theory/Method

XRF

When certain elements are bombarded with X-rays, electrons are emitted which result in energy released from the outer shells. Electrons can be ejected from the inner shell of atoms, causing them to drop down from the higher-level. When this event happens it is called “characteristic x-rays”.

Technical Specifications

Analytical range

from S to U

Simultaneous analysis of at most 24 elements or coating of above 5 layers

Detection limit

2ppm, analytical content: 2ppm to 99.9%

Coating thickness

0.005um minimum, within 20um (it depends on different materials)

Micro collimator

(minimum diameter: 0.1mm), test spot (within 0.2mm)

High-precision movable platform (position accuracy: below 0.005mm)

Arbitrary multiple optional analysis and identification models

Independent matrix effect correction models

Repeatability of multiple analyses reaches 0.05um (outermost layer Au below 1um)

Working stability over a long period

0.1um (outermost layer Au below 1um)

Temperature range

15°C to 30°C

Power

AC220V±5V, AC purified stabilized voltage power is recommended

Size

576×495×545 mm

Weight

90kg

Contact Us

1-877-884-8378