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Surface Waviness & Roughness Tester / Profilometer - QualiSurf III-Plus
Surface Waviness & Roughness Tester / Profilometer - QualiSurf III-Plus

Surface Waviness & Roughness Tester / Profilometer - QualiSurf™ III-Plus
Parent Product
Surface Roughness Tester - Profilometers
Application
Surface Roughness Testing
Standards
ANSI
ISO 1997
JIS 2001
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Unlock precision and versatility in surface analysis with the QualiSurf™ III Plus - a skid-less and skidded portable stylus surface waviness & roughness tester. This cutting-edge profilometer is designed for testing in workshops, laboratories, metrology centers, and more. It excels in measuring roughness, waviness, and primary profiles, providing digital and graphical test results on the screen while enabling data output to a PC for in-depth profile analysis.

Surface Waviness & Roughness Tester / Profilometer - QualiSurf™ III-Plus Overview

Unlock precision and versatility in surface analysis with the QualiSurf™ III Plus - a skid-less and skidded portable stylus surface waviness & roughness tester. This cutting-edge profilometer is designed for testing in workshops, laboratories, metrology centers, and more. It excels in measuring roughness, waviness, and primary profiles, providing digital and graphical test results on the screen while enabling data output to a PC for in-depth profile analysis.

Surface Waviness & Roughness Tester / Profilometer - QualiSurf III-Plus

Surface Waviness & Roughness Tester / Profilometer - QualiSurf™ III-Plus Key Features:

  • Windows Operating System: High calculation accuracy, rapid data processing, and a user-friendly interface.
  • Skid-less and Skidded Pick-up Stylus: Efficiently test curved surfaces' roughness with a detachable probe stylus.
  • Comprehensive Measurements: Capable of measuring surface roughness, waviness, and primary profiles.
  • Wide Measuring Range: Covers up to 1000μm with a maximum tracing length of 50mm.
  • 5.7-inch TFT LCD Screen: Displays evaluation curves clearly and conveniently.
  • Touch Screen: Easily set required parameters via the touch screen.
  • Mouse Operation: Allows for smooth navigation.
  • Large Data Storage: Store up to 10,000 sets of measuring conditions and data.
  • Data Storage on U Disk: Convenient data backup and transfer.
  • Powerful Analysis Software: Included for in-depth examination of measurement data.
  • Compliance: Conforms to roughness standards, including ISO4287-1997, JIS 0601: 2001, ANSI, and SEP1941-2012.

Standard Delivery Includes:

  • QualiSurf™ III Plus Main Unit.
  • Standard Pick-up Stylus Probe.
  • Probe Driver.
  • Calibration Certificate.
  • Portable Stand (for adjusting the stylus height).
  • Software and USB Cable.
  • Standard Plate.
  • Battery Charger.
  • Instruction Manual.
Surface Waviness & Roughness Tester / Profilometer - QualiSurf III-Plus

Unleash the power of precision surface analysis with the QualiSurf™ III Plus Surface Waviness & Roughness Tester - Profilometer, your ideal partner for assessing surface roughness, waviness, and primary profiles. Experience efficiency and reliability in one comprehensive package.

Surface Waviness & Roughness Tester / Profilometer - QualiSurf™ III-Plus Key Features:

  • Windows Operating System: High calculation accuracy, rapid data processing, and a user-friendly interface.
  • Skid-less and Skidded Pick-up Stylus: Efficiently test curved surfaces' roughness with a detachable probe stylus.
  • Comprehensive Measurements: Capable of measuring surface roughness, waviness, and primary profiles.
  • Wide Measuring Range: Covers up to 1000μm with a maximum tracing length of 50mm.
  • 5.7-inch TFT LCD Screen: Displays evaluation curves clearly and conveniently.
  • Touch Screen: Easily set required parameters via the touch screen.
  • Mouse Operation: Allows for smooth navigation.
  • Large Data Storage: Store up to 10,000 sets of measuring conditions and data.
  • Data Storage on U Disk: Convenient data backup and transfer.
  • Powerful Analysis Software: Included for in-depth examination of measurement data.
  • Compliance: Conforms to roughness standards, including ISO4287-1997, JIS 0601: 2001, ANSI, and SEP1941-2012.

Technical Specifications of QualiSurf™ III-Plus Surface Waviness & Roughness Tester / Profilometer:

ItemDescription
ProfileR, W, P, R-Motif, W-Motif
Measuring parametersSee the Table 1 below
FilterGauss, 2RC
Cutoff Length0.08mm, 0.25mm, 0.8mm, 2.5mm, 5mm, 8mm, 10mm
Evaluation length ln(1-5)l or setting by requirement
Measuring rangeY-axis:1000μm(±500μm)
X-axis: 50mm
Max. resolution0.0003μm
Tracing length50mm
Repeatability1.5%(Skid)，3%(Skid-less)
Storage10000 groups of measuring conditions and data
InterfaceUSB, RS232
PowerBuilt-in lithium-ion rechargeable batteries / External power adapter
Working temperature0°C~40°C
Storage temperature-25°C~60°C
Humidity<90%
Main unit dimension260mm×210mm×68mm
Main unit weight1.5Kg
Driver dimension195.5mm×60mm×122mm
Driver weight (with portable1.58Kg
Power adapterInput: 100 V~240VAC，50/60Hz; Output: 9V，3A

 

Available measuring parameters:

StandardProfile CurvesParameters
ISO1997RRa，Rq，Rz，Rp，Rv，Rsk, Rku, Rc, RPc *, RSm, R△q, Rmr*, Rmr(c)*, Rδc*, Rt,
Rz1max,Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Vo
PPa, Pq, Pz, Pp, Pv, Psk, Pku, Pc, PPc*, PSm, P△q, Pmr*, Pmr(c)*, Pδc*, Pt, Pz1max
WWa, Wq, Wz, Wp, Wv, Wsk, Wku, Wc, WPc1, WSm, W△q, Wmr*, Wmr(c)*, Wδc*, Wt, Wz1max
JIS2001RRa, Rq, Rz, Rp, Rv, Rsk, Rku, Rc, RSm, RzJIS, R△q, Rmr*, Rmr(c)*, Rδc*, Rt
PPa, Pq, Pz, Pp, Pv, Psk, Pku, Pc, PSm, PzJIS, P△q, Pmr*, Pmr(c)*, Pδc*, Pt
WWa, Wq, Wz, Wp, Wv, Wsk, Wku, Wc, WSm, WzJIS, W△q, Wmr*, Wmr(c)*, Wδc*, Wt
ANSIRRa, Rq, Rz, Rp, Rv, Rsk, Rku, RPc*, RSm, R△a, R△q,Htp*, tp*, Rt, Rmax, Rpm
WWa, Wq, Wz, Wp, Wv, Wsk, Wku, WPc*, WSm, W△a, W△q,Htp*, tp*, Wt, Wmax, Wpm
 

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Surface Roughness Tester - Profilometers